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Housed in the Tom Bevill Building is a Kratos Axis 165 SAM/XPS system. This instrument is used by the Chemistry Department and the Materials for Information Technology (MINT) program. The system is a multi-technique surface science tool capable of performing scanning electron microscopy and scanning Auger mapping of surfaces on the nanometer scale. The system also has a X-ray photoelectron spectroscopy attachment which with Auger electron spectroscopy allows identification of the surface composition and the oxidation states of many elements. The system consists of an ultrahigh vacuum (<10-9 Torr) sample transfer and analysis chambers onto which the analytical equipment is mounted. This instrument is part of the University's Central Analtytical Facility, which also houses a transmission electron microscope and a scanning electron microscope.
JEOL 7000 FE SEM
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