Surface Analytical Techniques

CH 622

Fall 2002

Lectures: MWF 9:00 - 9:50 AM

Room 331 Lloyd Hall

Instructor: Shane Street

Office: 325 Lloyd Office phone: 8-5957 email:

Office hours: MWF 10 am, or by appointment

Course description: This course is designed to introduce the student to the instrumentation and techniques used to study surfaces and interfaces. The techniques include: electron spectroscopy (AES, XPS), vibrational spectroscopy (RAIRS, HREELS, SERS), desorption techniques (TPD, SIMS), optical techniques (ellipsometry, SPR), and scanning probe microscopy (AFM, STM). Emphasis will be placed on metal and semiconductor surfaces since they are most widely encountered in catalysis, microelectronics, and magnetic materials.

Here's a pdf of the syllabus.

Dr. Earl Ada, research scientist at the Central Analytical Facilities here at UA, is putting together a significant online instructional resource. This will be particularly useful if you go on to learn to operate the Kratos SAM/XPS located in Bevill.

There is a fair amount of other good surface-related instructional material available on the Internet, although no claim is made here for their correctness. Examples include:

An Introduction to Surface Chemistry This is probably the best surface chemistry site on the web!

Simon Garrett's topical course He's at Michigan State, and this site is terrific.

An introductory tutorial on UHV Surface Science, with examples from my research, can be downloaded here as a pdf file.


FINAL Friday 13 Dec 02, 8 - 10:30 AM


Tentative Lecture Sequence

Introduction: Why surfaces?

The structure of metallic (crystalline) surfaces, single crystals, relaxation and reconstruction

Adsorption and desorption, isotherms, kinetics, bonding

Why UHV? Ultrahigh vacuum requirements, techniques

Electron spectroscopies: AES, XPS, LEED, RHEED

Surface vibrational spectroscopies: HREELS, RAIRS

Desorption techniques: TPD, SIMS

Scanning probe microscopy: AFM, STM

Optical techniques: spectroscopic ellipsometry and SPR



AES Auger electron spectroscopy

AFM atomic force microscopy

HREELS high-resolution electron energy-loss spectroscopy

LEED low energy electron diffraction

RHEED Reflection high energy electron diffraction

RAIRS reflection-absorption infrared spectroscopy

SERS surface-enhanced Raman spectroscopy

SIMS secondary ion mass spectrometry

SPM scanning probe microscopy

SPR surface plasmon resonance spectroscopy

STM scanning tunneling microscopy

TPD temperature programmed desorption

XPS x-ray photoelectron spectroscopy